STAr Sagittarius Series Offers 20 Years of Innovation in Semiconductor Testing

STAr Sagittarius Series Offers 20 Years of Innovation in Semiconductor Testing

The STAr Sagittarius Series, introduced in 2001, is a sophisticated test software designed for semiconductor parametric and reliability testing. It allows the integration of capacitance-voltage (CV) and current-voltage (IV) measurements into a single platform. As electronic applications have become increasingly diverse over the past 20 years, the Sagittarius System has been continually enhanced to meet evolving industry measurement requirements. Today, over 3,000 units have been deployed in foundries, design houses, and integrated device manufacturers (IDMs) worldwide.

The Sagittarius Series is WindowsTM-based semiconductor parametric test and device characterization test software and integrates seamlessly into most benchtop instruments and probe stations. The software is also a comprehensive tool and accelerates the measurement process. Its graphical configuration and intuitive graphical-based test sequences enable users easily to configure the test system with unlimited matrix or multiplexer and test resources such as SMU, and CMU by drag-and-drop with just a few clicks.

Moreover, the Sagittarius Series Intelligent Test System is under the master-slave operation and controls up to 32 slaves via internet connectivity. All test modes such as control, extra operation steps saving, test setup and test data files are in central management by Master which can view and collect the latest updates of all Salves system status. With full automation operation for multi-wafer, large statistics sample collection and built-in algorithms/libraries, Sagittarius Series ensures accurate and reliable measurement data for GaN, SiC, MOS, RFICs, RF MOSFET, Silicon Photonics Devices, Si/GaAs ICs, FPD and CMOS, etc.

STAr Sagittarius Family Series includes:

  • Sagittarius-TMS Intelligent Test & Measurement System
  • Sagittarius-RMS RF Measurement System
  • Sagittarius-ICT Interactive Curve Tracer
  • Sagittarius-SPT Silicon Photonics Test System
  • Sagittarius-WLR Wafer Level Reliability Test System
  • Sagittarius-MTM Multi-Test Mode System
  • Sagittarius-AMT Advanced Memory Tester