Toshiba Electronic Devices & Storage Corporation has launched "TLP3450S" a low-voltage photorelay for semiconductor testers. Semiconductor testers verify that DUT is operating correctly by applying a voltage/current to the specified pins of the device under test (DUT), such as the system LSI or semiconductor memory. Several photo relays (MOSFET output), a type of solid state relay, are used to switch the route of the specified pins.

ATE is required to be throughput-efficient to measure a lot of DUT with a large number of pins at once. Thus, high-speed switching is required to reduce the loss of test time due to switching. Also to meet this demand, photorelays are required to be miniaturized to mount a large number on a limited board space.

In addition, because of its small size and high-temperature operation, it is a semiconductor switch that can be used in a wide range of applications, including PLC (Programmable Logic Controller) and other industrial equipment, in addition to ATE applications.

The new TLP3450S uses a small S-VSON4T package. We have also improved the optical output of infrared LEDs and optimized the design of photo detector devices (photodiode arrays). As a result, the switching time (turn-on time) of the new product is 80 μs (max), which is 40% of the existing product TLP3450. In addition, TLP3450S has a smaller output capacitance that affects high-frequency signal leakage when the output is turned off, and a lower on-resistance that affects signal attenuation when the output is turned on. TLP3450S is suitable for the pin electronics of semiconductor testers, which measure DUT with high accuracy and at high speeds.