Using Test-to-Fail Methodology to Accurately Predict Projected Lifetime of eGaN® Devices in Common DC-DC Converter Topologies. During this recorded webinar, we will explore the cutting-edge Test-to-Fail methodology and its significance in precisely predicting the projected lifetime of eGaN devices in some of the most common DC-DC converter topologies. Watch the recorded webinar to learn more about: 1. An introduction to GaN technology and its advantages in common DC-DC converter topologies including a synchronous rectifier and a buck converter. 2. In-depth exploration of the Test-to-Fail methodology and its applicability in accurately forecasting device lifetimes. 3. Applying the Test-to-Fail methodology to a synchronous rectifier and a buck converter, considering both the high-side and low-side FETs. 4. Question and answer session to addresses live attendees specific queries and concerns. By watching this recorded webinar, you will gain valuable insights into the reliability of Gallium Nitride technology, specifically in the context of common DC-DC Converter topologies