This webinar focuses on the practical application of behavioral MOSFET models for the early-stage debugging of electromagnetic interference (EMI) issues in power electronic applications. By employing these models, participants can gain valuable insights into the intricate interactions between MOSFET behavior and EMI characteristics, facilitating more effective and timely debugging processes. The discussion aims to enhance understanding and proficiency in leveraging behavioral MOSFET models as a proactive approach to identifying and mitigating EMI challenges in power electronics.