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Reliability Lifecycle of GaN Power Devices

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  • Author: Kurt Smith & Ronald Barr
Transphorm utilizes standard JEDEC qualification testing prior to commercializing its GaN power devices to ensure that the quality of GaN devices will meet customer expectations for reliability. Beyond initial quality, we have used accelerated testing to predict how long the devices will last. High temperature testing has been used to predict device lifetimes due to temperature related degradation as the devices are passing current at low voltages. Additionally, the transition between the two operating conditions has been tested by operating the devices for extended periods of time at maximum operating conditions.
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