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Eaton capacitors dielectric performance under dc voltage stress

Eaton analyzed the circumstances and the investigation concluded that the cause of the failure was the dc withstand of all-film capacitors and how the higher dc levels present after de-energizing a capacitor bank compared with the dc withstand. The findings are also compounded by the fact that high temperature plays a role in the dc performance of the capacitor dielectric system. This, coupled with the higher dc voltages trapped in ungrounded-wye capacitor banks, was the root cause for the failures experienced by the utility. Given the field experience by this utility with capacitors from various manufacturers, Eaton concluded that this was most likely an industrywide concern.
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